Detection of exchange interaction in STM measurements through Fanolike interference effects

Abstract

We address Fano-like interference effects in scanning tunneling microscopy (STM) measurements of nanoscale systems, e.g. two-level systems. Common for these systems is that second order tunneling contributions give rise to interference effects that cause suppressed transmission through the system for certain energies. The suppressed transmission is measurable either in the differential conductance or in the bias voltage derivative thereof.