Dielectric microscopy with submillimeter resolution

Abstract

In analogy with optical near-field scanning methods, we use tapered dielectric waveguides as probes for a millimeter wave vector network analyzer. By scanning thin samples between two such probes we are able to map the spatially varying dielectric properties of materials with sub-wavelength resolution; using a 150 GHz probe in transmision mode we see spatial resolution of around 500 microns. We have applied this method to a variety of highly heterogeneous materials. Here we show dielectric maps of granite and oil shale.