Direct evidence for the suppression of charge stripes in epitaxial La$_{1.67}$Sr$_{0.33}$NiO$_4$ thin films

Abstract

We have successfully grown epitaxial La$_{1.67}$Sr$_{0.33}$NiO$_4$ films with a small crystalline mosaic using pulsed laser deposition. With synchrotron radiation, the x-ray diffraction peaks associated with charge stripes have been successfully observed for relatively thick films. Anomalies due to the charge-ordering transition have been examined using four-point probe resistivity measurements. X-ray scattering provides direct evidence for suppression of the stripe phase in thin samples; the phase disappears for film thicknesses $\leqslant$ 2600 ~\AA{}. The suppression appears to be a result of shrinking the stripe phase domains. This may reflect the stripe phase progressing from nematic to isotropic.