Quenched and Annealed Critical Points in Polymer Pinning Models

Abstract

We consider a polymer with configuration modeled by the path of a Markov chain, interacting with a potential u+Vn which the chain encounters when it visits a special state 0 at time n. The disorder (Vn) is a fixed realization of an i.i.d. sequence. The polymer is pinned, i.e. the chain spends a positive fraction of its time at state 0, when u exceeds a critical value. We assume that for the Markov chain in the absence of the potential, the probability of an excursion from 0 of length n has the form n-cφ(n) with c ≥ 1 and φ slowly varying. Comparing to the corresponding annealed system, in which the Vn are effectively replaced by a constant, it is known that the quenched and annealed critical points differ at all temperatures for 3/2<c<2 and c>2, but only at low temperatures for c<3/2. For high temperatures and 3/2<c<2 we establish the exact order of the gap between critical points, as a function of temperature. For the borderline case c=3/2 we show that the gap is positive provided φ(n) 0 as n ∞, and for c >3/2 with arbitrary temperature we provide a new proof that the gap is positive, and extend it to c=2.

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