Frequency dependence of dielectric anomaly around Neel temperature in bilayer manganite Pr(Sr0.1Ca0.9)2Mn2O7
Abstract
A novel frequency dependence of anomaly in dielectric constant versus temperature plot, around the Neel temperature TN (~150 K), has been observed in a single crystal of bilayer manganite Pr(Sr0.1Ca0.9)2Mn2O7. The anomaly in the permittivity (epsilon'||c) occurs at a temperature Tf which moves within a temperature window (delTf) of ~40 K around TN for a frequency range 50 kHz-5 MHz. The capacitive component Cp of the dielectric response exhibits a clear yet broad feature around TN which establishes the intrinsic capacitive nature of the anomaly.
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