A tool to estimate the critical dynamics and thickness of superconducting films and interfaces

Abstract

We demonstrate that the magnetic field dependence of the conductivity measured at the transition temperature allows the dynamical critical exponent, the thickness of thin superconducting films and interfaces, and the limiting lateral length to be determined. The resulting tool is applied to the conductivity data of an amorphous Nb0.15 Si0.85 film and a LaAlO3/SrTiO3 interface.