Tuning of electron transport through a moebius strip: shot noise

Abstract

We explore electron transport through a moebius strip attached to two metallic electrodes by the use of Green's function technique. A parametric approach is used based on the tight-binding model to characterize the electron transport through such a bridge system and it is observed that the transport properties are significantly affected by (a) the transverse hopping strength between the two channels and (b) the strip-to-electrode coupling strength. In this context we also describe the noise power of the current fluctuations that provides a key information about the electron correlation which is obtained by calculating the Fano factor ($F$). The knowledge of this current fluctuations gives important ideas for fabrication of efficient electronic devices.