Andreev reflection measurements in nanostructures with amorphous WCx superconducting contacts
Abstract
Point-contact Andreev reflection measurements of Co/ and Cu/tungsten-carbide (WCx) contacts are presented. Metallic thin films were patterned by e-beam-lithography and lift-off; tungsten carbide superconducting tips were grown directly on the pre-patterned samples by decomposition of a metallo-organic vapour (tungsten hexacarbonyl) under a focused Ga+-ion beam (FIB). Current-voltage measurements as a function of temperature and magnetic field clearly showed the signatures of Andreev reflection. The experimental conductance-voltage curves were analyzed within the Blonder-Tinkham-Klapwijk theory. The results highlight the possibilities, advantages and disadvantages of using FIB-produced amorphous WCx tips for point-contact spectroscopy in metallic nanostructures.
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