Raman light scattering study and microstructural analysis of epitaxial films of the electron-doped superconductor La2-xCexCuO4
Abstract
We present a detailed temperature-dependent Raman light scattering study of optical phonons in molecular-beam-epitaxy-grown films of the electron-doped superconductor La2-xCexCuO4 close to optimal doping (x ~ 0.08, Tc = 29 K and x ~ 0.1, Tc = 27 K). The main focus of this work is a detailed characterization and microstructural analysis of the films. Based on micro-Raman spectroscopy in combination with x-ray diffraction, energy-dispersive x-ray analysis, and scanning electron microscopy, some of the observed phonon modes can be attributed to micron-sized inclusions of Cu2O. In the slightly underdoped film (x ~ 0.08), both the Cu2O modes and others that can be assigned to the La2-xCexCuO4 matrix show pronounced softening and narrowing upon cooling below T ~ Tc. Based on control measurements on commercial Cu2O powders and on a comparison to prior Raman scattering studies of other high-temperature superconductors, we speculate that proximity effects at La2-xCexCuO4/Cu2O interfaces may be responsible for these anomalies. Experiments on the slightly overdoped La2-xCexCuO4 film (x ~ 0.1) did not reveal comparable phonon anomalies.
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