High frequency polarization switching of a thin ferroelectric film
Abstract
We consider both experimentally and analytically the transient oscillatory process that arises when a rapid change in voltage is applied to a BaxSr1-xTiO3 ferroelectric thin film deposited on an Mg0 substrate. High frequency (≈ 108 rad/s) polarization oscillations are observed in the ferroelectric sample. These can be understood using a simple field-polarization model. In particular we obtain analytic expressions for the oscillation frequency and the decay time of the polarization fluctuation in terms of the material parameters. These estimations agree well with the experimental results.
Turn this paper into a lesson
ArcXiv compiles a structured reading guide from this paper's metadata: plain-English importance, contributions, prerequisite concepts, which sections to read first, flashcards, and a quiz. Grounded in the abstract, never invented.