Wrapper/TAM Co-Optimization and Test Scheduling for SOCs Using Rectangle Bin Packing Considering Diagonal Length of Rectangles

Abstract

This paper describes an integrated framework for SOC test automation. This framework is based on a new approach for Wrapper/TAM co-optimization based on rectangle packing considering the diagonal length of the rectangles to emphasize on both TAM widths required by a core and its corresponding testing time. In this paper, we propose an efficient algorithm to construct wrappers that reduce testing time for cores. We then use rectangle packing to develop an integrated scheduling algorithm that incorporates power constraints in the test schedule. The test power consumption is important to consider since exceeding the system's power limit might damage the system.