Optical Spectra of Graded Nanostructured TiO2 Chiral Thin Films

Abstract

The rigorous coupled wave analysis method (RCWA) is applied to the graded chiral TiO2 thin films in axial and non-axial excited states using the Bruggeman homogenization formalism. The dependence of the filtering frequency and polarization selectivity as a function of different structural parameters, are investigated. A good agreement with experimental results reported by other researchers is achieved.