Frustrated Total Internal Reflection: Resonant and Negative Goos-H\"anchen Shifts in Microwave Regime

Abstract

It is well-known that the variations of Goos-H\"anchen shifts (GHSs) are closely associated with the enengy-flux provided by evanescent states in the case of total internal reflection. However, when the frustrated internal total reflection (FTIR) is realized with a Polymethyl Methacrylate (PMMA) double-prism system operated in the microwave frequency range of 8.2 GHz to 12.4 GHz, we observe that the GH shifts for the reflected beam show periodic resonances with varying the operation frequency or the air layer thickness, which is different from the variation of the corresponding reflected energy. Moreover, in another FTIR based system introduced by a composite absorptive material slab with a two-dimensional top layer of frequency selective surface (FSS), the GHSs for reflected beam are discovered as not only resonant but also negative with the incidence of transverse electric that is TE polarized.