Random backaction in tunneling of single electrons through nanostructures

Abstract

We derive an $n$-resolved Master equation for quantum transport that includes a dependence on the number $n$ of tunneled electrons in system parameters such as tunnel rates and energy levels. We apply the formalism to describe dynamical changes due to random backaction effects, for example due to local fluctuations of the electrostatic landscape during the transport process. We quantify the amount of additional noise on top of electron shot noise due to these fluctuations by giving explicit expressions both for sequential and coherent tunneling examples.