Electronic phase transitions in Pr0.5Ca0.5MnO3 epitaxial thin films revealed by resonant soft x-ray scattering

Abstract

We report the study of magnetic and orbital order in Pr0.5Ca0.5MnO3 epitaxial thin films grown on (LaAlO3)0.3-(SrAl0.5Ta0.5O3)0.7 (LSAT) (011)c. In a new experimental approach, the polarization and energy dependence of resonant soft x-ray scattering are used to reveal significant modifications of the magnetic order in the film as compared to the bulk, namely (i) a different magnetic ordering wave vector, (ii) a different magnetic easy axis and (iii) an additional magnetic reordering transition at low temperatures. These observations indicate a strong impact of the epitaxial strain on the spin order, which is mediated by the orbital degrees of freedom and which provides a promising route to tune the magnetic properties of manganite films. Our results further demonstrate that resonant soft x-ray scattering is a very suitable technique to study the magnetism in thin films, to which neutron scattering cannot easily be applied due to the small sample volume.

0

Discussion (0)

Sign in to join the discussion.

Loading comments…