Steady-state cracking in brittle substrates beneath adherent films: revisited
Abstract
This is a technical note aiming at the re-examination of the phenomenon of the steady-state cracking in the two-layer system. The method of Suo and Hutchinson, as introduced in their 1989 paper, is followed. Our solution is compared with the one appearing in that paper for the substrate-to-film thickness ratio λ0=10. We obtain results at three λ0<10 values. Combined with the results for λ0=10, the new sets of values cover thickness ratios between 1 and 10, sufficient for determining crack initiation and propagation in almost every relevant problem. We present our results in tables (and figures), thus facilitating their implementation and use.
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