Measurement of the coupling between applied stress and magnetism in a manganite thin film
Abstract
We measured the magnetization depth profile of a (La1-xPrx)1-yCayMnO3 (x = 0.600.04, y = 0.200.03) film as a function of applied bending stress using polarized neutron reflectometry. From these measurements we obtained a coupling coefficient relating strain to the depth dependent magnetization. We found application of compressive (tensile) bending stress along the magnetic easy axis increases (decreases) the magnetization of the film.
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