Shifts of optical frequency references based on spectral-hole burning in Eu:Y2SiO5

Abstract

Several properties of Eu:Y2SiO5 spectral holes are measured, to assess the suitability of broad-band hole-patterns for use as laser-frequency references. We measure frequency shifts due to magnetic fields, side-features of neighboring spectral holes, and changing optical probe power. A precise calibration of a temperature insensitive point is also performed, where the temperature-induced frequency shift is canceled to first order by the pressure-induced shift from the crystal's helium-gas environment.