Interface characterization of Co2MnGe/Rh2CuSn Heusler multilayers
Abstract
All-Heusler multilayer structures have been investigated by means of high kinetic x-ray photoelectron spectroscopy and x-ray magnetic circular dichroism, aiming to address the amount of disorder and interface diffusion induced by annealing of the multilayer structure. The studied multilayers consist of ferromagnetic Co2MnGe and non-magnetic Rh2CuSn layers with varying thicknesses. We find that diffusion begins already at comparably low temperatures between 200 C and 250 C, where Mn appears to be most prone to diffusion. We also find evidence for a 4 thick magnetically dead layer that, together with the identified interlayer diffusion, are likely reasons for the small magnetoresistance found for current-perpendicular-to-plane giant magneto-resistance devices based on this all-Heusler system.
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