Interpreting motion and force for narrow-band intermodulation atomic force microscopy

Abstract

Intermodulation atomic force microscopy (ImAFM) is a mode of dynamic atomic force microscopy that probes the nonlinear tip-surface force by measurement of the mixing of multiple tones in a frequency comb. A high $Q$ cantilever resonance and a suitable drive comb will result in tip motion described by a narrow-band frequency comb. We show by a separation of time scales, that such motion is equivalent to rapid oscillations at the cantilever resonance with a slow amplitude and phase or frequency modulation. With this time domain perspective we analyze single oscillation cycles in ImAFM to extract the Fourier components of the tip-surface force that are in-phase with tip motion ($F_I$) and quadrature to the motion ($F_Q$). Traditionally, these force components have been considered as a function of the static probe height only. Here we show that $F_I$ and $F_Q$ actually depend on both static probe height and oscillation amplitude. We demonstrate on simulated data how to reconstruct the amplitude dependence of $F_I$ and $F_Q$ from a single ImAFM measurement. Furthermore, we introduce ImAFM approach measurements with which we reconstruct the full amplitude and probe height dependence of the force components $F_I$ and $F_Q$, providing deeper insight into the tip-surface interaction. We demonstrate the capabilities of ImAFM approach measurements on a polystyrene polymer surface.