Direct and Parallel Tomography of a Quantum Process

Abstract

As the method to completely characterize quantum dynamical processes, quantum process tomography (QPT) is vitally important for quantum information processing and quantum control, where the faithfulness of quantum devices plays an essential role. Here via weak measurements, we present a new QPT scheme characterized by its directness and parallelism. Comparing with the existing schemes, our scheme needs a simpler state preparation and much fewer experimental setups. Furthermore, each parameter of the quantum process is directly determined from only five experimental values in our scheme, meaning that our scheme is robust against the accumulation of errors.