Dynamic synchrotron X-ray imaging study of effective temperature in a vibrated granular medium

Abstract

We present a dynamic synchrotron X-ray imaging study of the effective temperature $T_{eff}$ in a vibrated granular medium. By tracking the directed motion and the fluctuation dynamics of the tracers inside, we obtained $T_{eff}$ of the system using Einstein relation. We found that as the system unjams with increasing vibration intensities $\Gamma$, the structural relaxation time $\tau$ increases substantially which can be fitted by an Arrhenius law using $T_{eff}$. And the characteristic energy scale of structural relaxation yielded by the Arrhenius fitting is $E = 0.21 \pm 0.02$ $pd^3$, where $p$ is the pressure and $d$ is the background particle diameter, which is consistent with those from hard sphere simulations in which the structural relaxation happens via the opening up of free volume against pressure.