Soft x-ray photoemission study of new BiS2-layered superconductor LaO1-xFxBiS2
Abstract
We use core level and valence band soft x-ray photoemission spectroscopy (SXPES) to investigate electronic structure of new BiS2 layered superconductor LaO1-xFxBiS2. Core level spectra of doped samples show a new spectral feature at the lower binding energy side of the Bi 4f main peak, which may be explained by core-hole screening with metallic states near the Fermi level (E F). Experimental electronic structure and its x dependence (higher binding energy shift of the valence band as well as appearance of new states near E F having dominant Bi 6p character) were found to be consistent with the predictions of band structure calculations in general. Noticeable deviation of the spectral shape of the states near E F from that of calculations might give insight into the interesting physical properties. These results provide first experimental electronic structure of the new BiS2 layered superconductors.
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