Diagnosing a strong topological insulator by quantum oscillations

Abstract

We show how quantum oscillation measurements of surface states in an insulator may allow to diagnose a strong topological insulator and distinguish it from its weak or topologically trivial counterpart. The criterion is defined by the parity of the number of fundamental frequencies in the surface-state quantum oscillation spectrum: an even number of frequencies implies a weak or a topologically trivial insulator, whereas an odd number points to a strong topological insulator. We also discuss various aspects and issues related to applying this criterion in practice.