A contactless microwave-based diagnostic tool for high repetition rate laser systems

Abstract

We report on a novel electro-optic device for the diagnostics of high repetition rate laser systems. It is composed of a microwave receiver and of a second order nonlinear crystal, whose irradiation with a train of short laser pulses produces a time-dependent polarization in the crystal itself as a consequence of optical rectification. This process gives rise to the emission of microwave radiation that is detected by a receiver and is analyzed to infer the repetition rate and intensity of the pulses. We believe that this new method may overcome some of the limitations of photodetection techniques.