Mechanisms of Electromechanical Coupling in Strain Based Scanning Probe Microscopy

Abstract

Electromechanical coupling is ubiquitous in nature and underpins the functionality of materials and systems as diverse as ferroelectric and multiferroic materials, electrochemical devices, and biological systems, and strain-based scanning probe microscopy (s-SPM) techniques have emerged as a powerful tool in characterizing and manipulating electromechanical coupling at the nanoscale. Uncovering underlying mechanisms of electromechanical coupling in these diverse materials and systems, however, is a difficult outstanding problem, and questions and confusions arise from recent experiment observations of electromechanical coupling and its apparent polarity switching in some unexpected materials. We propose a series of s-SPM experiments to identify different microscopic mechanisms underpinning electromechanical coupling, and demonstrate their feasibility using three representative materials. By employing a combination of spectroscopic studies and different modes of s-SPM, we show that it is possible to distinguish electromechanical coupling arising from spontaneous polarization, induced dipole moment, and ionic Vegard strain, and this offer a clear guidance on using s-SPM to study a wide variety of functional materials and systems.