Phenomenological Modeling of Memristive Devices

Abstract

We present a computationally inexpensive yet accurate phenomenological model of memristive behavior in titanium dioxide devices by fitting experimental data. By design, the model predicts most accurately I-V relation at small non-disturbing electrical stresses, which is often the most critical range of operation for circuit modeling. While the choice of fitting functions is motivated by the switching and conduction mechanisms of particular titanium dioxide devices, the proposed modeling methodology is general enough to be applied to different types of memory devices which feature smooth non-abrupt resistance switching.