Control of Thermoelectric Properties of ZnO using Electric Double Layer

Abstract

We have successfully controlled thermoelectric properties of ZnO by changing carrier concentration using an electric double layer transistor (EDLT) which is a feld effect transistor gated by electrolyte solution. The resistivity and the thermopower decreased abruptly by applying gate voltage larger than a threshold voltage ( 2V), indicating the increase of carrier concentration on the ZnO surface. The temperature dependence of resistivity became metallic, which is characterized by weak temperature dependence of the resistivity, when gate voltage exceeded 2V. Corresponding to the resistivity, the temperature dependence of thermopower changed remarkably. The thickness of the induced metallic layer was estimated to be about 10nm from the critical carrier concentration of metal-insulator transition, and the power factor was calculated to ~8*10-5Wm-1K2. Although the power factor is not as large as bulk ZnO ceramics of optimum doping condition, EDLT is considered to be a useful way to optimize thermoelectric properties by tuning carrier concentration.