Extremely low inhomogeneous broadening of exciton lines in shallow (In,Ga)As/GaAs quantum wells
Abstract
We study radiative linewidth of exciton resonance in shallow InxGa1-xAs/GaAs single quantum wells as a function of indium concentration in the range x=0.02...0.10 and well thickness in the range LZ=1...30 nm using the method of Brewster reflection spectroscopy. Record linewidths of heavy-hole exciton resonance of about 130...180 μeV are measured in reflection spectra for single quantum wells with LZ=2 nm and x=0.02 at temperature 9 K. In these spectra, the non-radiative linewidth including inhomogeneous broadening can be comparable or even less than radiative linewidth. It is shown that radiative linewidth weakly depends on x and LZ in these ranges. In multiple-quantum-well Bragg structure with ten periods radiative linewidth exceeds inhomogeneous broadening by 4 times.