MCDF-RCI predictions for structure and width of $K\alpha_{1,2}$ x-ray line of Al and Si

Abstract

Multiconfiguration Dirac-Fock and Relativistic Configuration Interaction methods have been employed to predict the structure and the width of $K\alpha_{1,2}$ x-ray lines of Al and Si. The influences of electron correlation and inclusion of possible satellite contributions on spectra structure have been studied. The widths of $K$ and $L_{2,3}$ atomic levels of Al and Si have been also computed.