Switching Current Distributions in Josephson Junctions at Very Low Temperatures

Abstract

Swept bias experiments carried out on Josephson junctions yield the distributions of the probabilities of early switching from the zero voltage state. Kramers' theory of thermally activated escape from a one-dimensional potential is well known to fall short of explaining such experiments when the junctions are at millikelvin temperatures. We propose a simple revision of the theory which is shown to yield extremely good agreement with experimental data.