Introduction to Quantum Gate Set Tomography

Abstract

Quantum gate set tomography (GST) has emerged as a promising method for the full characterization of quantum logic gates. In contrast to quantum process tomography (QPT), GST self-consistently and correctly accounts for state preparation and measurement (SPAM) errors. It therefore provides significantly more accurate estimates than QPT as gate fidelities increase into the fault-tolerant regime. We give a detailed review of GST and provide a self-contained guide to its implementation. The method is presented in a step-by-step fashion and relevant mathematical background material is included. Our goal is to demonstrate the utility of GST as both an accurate characterization technique and a simple and effective diagnostic tool. As an illustration, we compare the output of GST and QPT using simulated example data for a single qubit. In agreement with the original literature, we find that coherent errors are poorly estimated by QPT near quantum error correction thresholds, while GST is accurate in this regime.