Thermal boundary resistance from transient nanocalorimetry: a multiscale modeling approach

Abstract

The Thermal Boundary Resistance at the interface between a nanosized Al film and an Al_{2}O_{3} substrate is investigated at an atomistic level. A room temperature value of 1.4 m^{2}K/GW is found. The thermal dynamics occurring in time-resolved thermo-reflectance experiments is then modelled via macro-physics equations upon insertion of the materials parameters obtained from atomistic simulations. Electrons and phonons non-equilibrium and spatio-temporal temperatures inhomo- geneities are found to persist up to the nanosecond time scale. These results question the validity of the commonly adopted lumped thermal capacitance model in interpreting transient nanocalorimetry experiments. The strategy adopted in the literature to extract the Thermal Boundary Resistance from transient reflectivity traces is revised at the light of the present findings. The results are of relevance beyond the specific system, the physical picture being general and readily extendable to other heterojunctions.