Characterization of YbNi4(P1- xAs x)2, x = 0, 0.2 single crystals grown by Czochralski method

Abstract

We have investigated large single crystals of YbNi4P2 that were grown from a levitating melt by the Czochralski method. The new samples facilitate the determination of the absolute values of the electrical resistivity. Phase pure polycrystalline samples of the non-magnetic reference LuNi4P2 were prepared and the electrical resistivity was measured. Furthermore we have grown a single crystal of the As substituted compound YbNi4(P1- xAs x)2, x = 0.2 and investigated the homogenity of the As distribution.

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