Scattering mechanisms of highest-mobility InAs/AlxGa1-xSb quantum wells
Abstract
We study molecular beam epitaxially grown, undoped AlxGa1-xSb/InAs/AlSb quantum wells with different buffer and barrier designs and varying quantum well width. The highest mobilities were achieved with Al0.33Ga0.67Sb buffers and lower barriers and a quantum well width of 24 nm. These quasi-single-interface InAs/AlSb quantum well devices reached a gate-tuned mobility of 2.4~×~106~cm2/Vs at a density of 1× 1012 cm-2 and 1.3 K. In Hall bar devices boundary scattering is found to strongly influence the mobility determination in this mobility regime. Ionized background impurity scattering at low electron densities, device boundary scattering at intermediate electron densities, and intersubband scattering at high electron densities were identified as most likely dominant scattering processes. Ringlike structures in the Landau fan can be explained using a single-particle model of crossing Landau levels.
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