Polarization dependence of transverse photo-induced voltage in gold thin film with random nanoholes
Abstract
Transverse photo-induced voltage (TPIV) in 25nm-thick Au film with random holes with 100 nm in diameter is measured for linearly, circularly and elliptically polarized light. By rotating the major axis of ellipse of the light, TPIV exhibits specific pattern depending on polarization. The experimental results are readily reproduced by assuming that the angular momentum transfer from the light beam to the film is responsible for TPIV. A novel ellipticity meter is proposed based on this mechanism.
0
Turn this paper into a lesson
ArcXiv compiles a structured reading guide from this paper's metadata: plain-English importance, contributions, prerequisite concepts, which sections to read first, flashcards, and a quiz. Grounded in the abstract, never invented.