Strain effect engineered in {\alpha}-Al2O3/monolayer MoS2 interface by first principle calculations

Abstract

With the advances in low dimensional transition metal dichalcolgenides (TMDCs) based metal oxide semiconductor field effect transistor (MOSFET), the interface between semiconductors and dielectrics has received considerable attention due to its dramatic effects on the morphology and charge transport of semiconductors. In this study, first principle calculations were utilized to investigate the strain effect induced by the interface between Al2O3 (0001) and monolayer MoS2. The results indicate that Al2O3 in 1.3nm thickness can apply the strain of 0.3% on MoS2 monolayer. The strain effect monotonically increases with the larger thickness of the dielectric layer. Also, the study on temperature effect indicates the monotonic lattice expansion induced by the higher temperature. Our study proposes that the dielectric engineering can be an effective tool for strain effect in the nanotechnology.