Eigenfunction scarring and improvements in L∞ bounds
Abstract
We study the relationship between L∞ growth of eigenfunctions and their L2 concentration as measured by defect measures. In particular, we show that scarring in the sense of concentration of defect measure on certain submanifolds is incompatible with maximal L∞ growth. In addition, we show that a defect measure which is too diffuse, such as the Liouville measure, is also incompatible with maximal eigenfunction growth.
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