Structural and dielectric characterization of Sm2MgMnO6

Abstract

The polycrystalline Sm2MgMnO6 (SMMO) was synthesized at 1173K by means of sol-gel technique. Rietveld refine-ment of X-ray diffraction (XRD) pattern confirmed the formation of a single phase monoclinic structure with space group P21/n. The band gap achieved from UV-vis spectra shows the semiconducting nature of the material. To observe the effect of grains and grain-boundaries in the conduction process and dielectric relaxation measurements are carried out on SMMO sample at different frequencies between 313 K and 673 K. An electrical equivalent circuit consisting of the resistance and constant phase element is used to clarify the impedance data.