Dielectric Properties of Metal-Organic Frameworks Probed via Synchrotron Infrared Reflectivity

Abstract

We present the frequency-dependant (dynamic) dielectric response of a group of topical polycrystalline zeolitic imidazolate-based metal-organic framework (MOF) materials in the extended infrared spectral region. Using synchrotron-based FTIR spectroscopy in specular reflectance, in conjunction with density functional theory (DFT) calculations, we have revealed detailed structure-property trends linking the THz region dielectric response to framework porosity and structural density. The work demonstrates that MOFs are promising candidate materials not only for low-\k{appa} electronics applications but could also be pioneering for terahertz (THz) applications, such as next-generation broadband communications technologies.