Bulk transport properties of Bismuth selenide thin films approaching the two-dimensional limit

Abstract

We have investigated the transport properties of topological insulator Bi2Se3 thin films grown using magnetron sputtering with an emphasis on understanding the behavior as a function of thickness. We show that thickness has a strong influence on all aspects of transport as the two-dimensional limit is approached. Bulk resistivity and Hall mobility show disproportionately large changes below 6 quintuple layer which we directly correlate to an increase in the bulk band gap of few-layer Bi2Se3, an effect that is concomitant with surface gap opening. A tendency to crossover from a metallic to an insulating behavior in temperature-dependent resistivity measurements in ultra-thin Bi2Se3 is also consistent with an increase in the bulk band gap along with enhanced disorder at the film-substrate interface. Our work highlights that the properties of few-layer Bi2Se3 are tunable that may be attractive for a variety of device applications in areas such as optoelectronics, nanoelectronics and spintronics.