Measurement of the 20F half-life
Abstract
The half-life of the 20F ground state has been measured using a radioactive beam implanted in a plastic scintillator and recording βγ coincidences together with four CsI(Na) detectors. The result, T1/2 = 11.0011(69) stat(30) sys~s, is at variance by 17 combined standard deviations with the two most precise results. The present value revives the poor consistency of results for this half-life and calls for a new measurement, with a technique having different sources of systematic effects, to clarify the discrepancy.
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