Laboratory characterization of SLS-based infrared detectors for precision photometry

Abstract

Strained layer superlattice (SLS) detectors are a new class of infrared detectors available in the scientific and commercial markets. The photosensitive bandpass is set by material and engineered properties with typical detectors covering 7.5- 10.5 microns, bluer than traditional N-band filters. SLS detectors have the potential to reach lower dark current than traditional infrared materials (like HgCdTe) allowing comparable photometric sensitivity at higher detector temperatures, easing cooling requirements. Conversely, at equal cryogenic temperatures the SLS detector will have lower dark current than HgCdTe allowing better photometric sensitivity under dark current limited operation. This work presents laboratory measurements of SLS detectors to quantify detector linearity and time stability. The potential advantages in using SLS- based detectors in future astronomical instruments is also discussed.