Dielectric Properties of Conductively Loaded Polyimides in the Far Infrared
Abstract
The dielectric properties of selected conductively-loaded polyimide samples are characterized in microwave through far infrared wavebands. These materials, belonging to the Vespel family, are more readily formed by direct machining than their ceramic loaded epoxy counterparts and present an interesting solution for realizing absorptive optical control structures. Measurements spanning a spectral range from 1 to 600\, cm-1 (0.03 to 18\,THz) were preformed and used in parametrization of the media's dielectric function at frequencies below ≈3\,THz.
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