The Core Diffusion-Drift Field-Effect Transistor Theory Including Quantum and Interface Trap Capacitances

Abstract

We have decomposed the modeling of the field-effect transistors into the two independent parts: the current continuity based kinetics and the charge neutrality based electrostatics. The former part, that is universal for all FETs, leads to an explicit and closed form of I-V characteristics as a function of the total channel charge. The latter part, which is specific for a particular material and geometric configurations can be considered as an independent engineering task. The quantum capacitance and the interface trap density are consistently incorporated into the solution of the current continuity equation in the diffusion-drift approximation, providing a complete consistency in the current and the capacitance small-signal characteristics.