Pressure metrics and Manhattan curves for Teichm\"uller spaces of punctured surfaces

Abstract

In this paper, we extend the construction of pressure metrics to Teichm\"uller spaces of surfaces with punctures. This construction recovers Thurston's Riemannian metric on Teichm\"uller spaces. Moreover, we prove the real analyticity and the convexity of Manhattan curves of the finite area type-preserving Fuchsian representations, and thus we obtain several related entropy rigidity results. Lastly, relating the two topics mentioned above, we show that one can derive the pressure metric by varying Manhattan curves.