Magnetic characteristics of epitaxial NiO films studied by Raman spectroscopy

Abstract

Raman spectroscopy is utilized to study the magnetic characteristics of heteroepitaxial NiO thin films grown by plasma-assisted molecular beam epitaxy on MgO(100) substrates. For the determination of the N\'eel temperature, we demonstrate a reliable approach by analyzing the temperature dependence of the Raman peak originating from second-order scattering by magnons. The antiferromagnetic coupling strength is found to be strongly influenced by the growth conditions. The low-temperature magnon frequency and the N\'eel temperature are demonstrated to depend on the biaxial lattice strain and the degree of structural disorder which is dominated by point defects.