Low Temperature Homoepitaxy Of (010) β-Ga2O3 By Metalorganic Vapor Phase Epitaxy : Expanding The Growth Window
Abstract
In this work, we report on the growth of high-mobility β-Ga2O3 homoepitaxial thin films grown at a temperature much lower than the conventional growth temperature window for metalorganic vapor phase epitaxy. Low-temperature β-Ga2O3 thin films grown at 600C on Fe-doped (010) bulk substrates exhibits remarkable crystalline quality which is evident from the measured room temperature Hall mobility of 186 cm2/Vs for the unintentionally doped films. N-type doping is achieved by using Si as a dopant and controllable doping in the range of 2×1016 - 2×1019 cm-3 is studied. Si incorporation and activation is studied by comparing silicon concentration from secondary ion mass spectroscopy (SIMS) and electron concentration from temperature-dependent Hall measurements. The films exhibit high purity (low C and H concentrations) with a very low concentration of compensating acceptors (2×1015 cm-3) even at this growth temperature. Additionally, abrupt doping profile with forward decay of 5nm/dec (10 times improvement compared to what is observed for thin films grown at 810C) is demonstrated by growing at a lower temperature.