Test Set Optimization by Machine Learning Algorithms

Abstract

Diagnosis results are highly dependent on the volume of test set. To derive the most efficient test set, we propose several machine learning based methods to predict the minimum amount of test data that produces relatively accurate diagnosis. By collecting outputs from failing circuits, the feature matrix and label vector are generated, which involves the inference information of the test termination point. Thus we develop a prediction model to fit the data and determine when to terminate testing. The considered methods include LASSO and Support Vector Machine(SVM) where the relationship between goals(label) and predictors(feature matrix) are considered to be linear in LASSO and nonlinear in SVM. Numerical results show that SVM reaches a diagnosis accuracy of 90.4% while deducting the volume of test set by 35.24%.