Mueller matrix maps of dichroic filters reveal polarization aberrations
Abstract
Dichroic filters are used by instrument designers to split a field of view into different optical paths for simultaneous measurement of different spectral bands. Quantifying the polarization aberrations of a dichroic is relevant for predicting the incident polarization states downstream, which could affect the performance of diffraction limited systems. One important application is the fore-optics of exoplanet imaging coronagraphs. In this work, the polarization properties of the Edmund #69-205 650 nm roll-off dichroic are measured using a rotating retarder Mueller matrix imaging polarimeter. The polarization properties of this commercial dichroic are compared at normal and 45 angle of incidence. The normal incidence measurements verify the instrument calibration since no polarization aberrations were observed. Transmission measurements at 680 nm and 45 yield a 2.9 rad magnitude of retardance and 0.95 diattenuation. Effectively, at 630 nm the dichroic is a λ/4 waveplate with a horizontal fast-axis.